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Portable Research Grade Atomic Force Microscope

Portable Research Grade Atomic Force Microscope

  • Educational Scanning Probe Microscope
  • Contact & non-Contact Modes
  • 1nm X &Y Axis Resolution
  • 1nm Z Axis Resolution

Description

Portable Research Grade Scanning Probe Microscope Standard Version Mode: Contact & non-Contact Modes XY Scanner: 30µm Maximum XY Scan Range 1nm XY Resolution Z Scanner: 2µm Z Scan Range 1nm X Resolution AFM Unit Dimension 300mm x 400 mm x 300 mm Net Weight 20 Kg
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